Single‐Nanoparticle Collision Events: Tunneling Electron Transfer on a Titanium Dioxide Passivated n‐Silicon Electrode

Single‐nanoparticle collisions were observed on an n‐type silicon electrode (600 μm diameter) passivated by a thin layer of amorphous TiO₂, where the current steps occurred by tunneling electron transfer. The observed collision frequency was in reasonable agreement with that predicted from theory. The isolated electrode, after a collision experiment, with a Pt/TiO₂/n‐Si architecture was shown to retain the photoelectrochemical properties of n‐Si without photocorrosion or current decay. The Pt/TiO₂/n‐Si electrode produced 19 mA cm^?2 of photocurrent density under 100 mW cm^?2 irradiation from a xenon lamp during oxygen evolution without current fading for over 12 h.