首页 | 本学科首页   官方微博 | 高级检索  
     


On the recovery of error patterns from signatures obtained in digital system testing
Authors:P. P. Nicolaou  C. C. Lefas
Affiliation:(1) Dept. of Electronics, Technical University of Crete, 19, Arapaki Str, 176.76, Kallithea, Athens, Greece
Abstract:Error patterns are lost in the data compression process inherent in signature analysis. These however contain useful information about the faults in faulty units. The present paper investigates the possibility to recover the lost error patterns from the signatures obtained at the end of a test run. It is shown that, the recovery is possible if the test outcome sequence is not longer than the signature analyser period and if the number of possible error signatures can be reduced to a subset a priori known.
Keywords:B.1.3  B.2.3  E4
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号