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| Additional microstructural analysis on the samples examined in the paper ‘Are high resolution resistometric methods really useful for the early detection of electromigration damage?’ | |
| 摘 要： | |
| 收稿时间： | 11 September 1998 |
| 修稿时间： | 29 January 1999 |
| 本文献已被 ScienceDirect 等数据库收录！ | |