Speckle technique for dynamic drop profile measurement on rough surfaces |
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Authors: | Jason A. Schmucker Joshua C. Osterhout Edward B. White |
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Affiliation: | (1) Department of Aerospace Engineering, Texas A&M University, College Station, TX 77843, USA |
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Abstract: | A technique has been developed for measuring three-dimensional instantaneous drop profiles on rough surfaces. The surface is illuminated using a laser and images are captured of the resulting speckle pattern with and without the drop in place. The analysis consists of finding the contact line, measuring the deformation of the speckle field caused by refraction of light at the drop surface, then reconstructing the drop using simulated annealing optimization to find the drop shape whose shift vector field best matches the one measured. An error analysis of the technique was performed using a Monte Carlo technique and comparisons to sideview drop images for a large sample of drops. Mean contact angle measurement error was found to be −1.6° with a 1 − σ error bound of −6.9°, +2.0°. |
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