结合断言与覆盖率为导向的验证方法

伴随着半导体工艺的不断发展,可以将更多的功能集成到单系统芯片上.这对传统的验证方法和验证途径提出了种种挑战.以覆盖率为导向的验证方法中,覆盖率模型是在外部通过DUT执行的功能来统计覆盖率,很难侦测到DUT内部的工作状态,存在对功能"遗漏点"的侦测.基于断言的验证方法可以将断言加入到DUT内部,通过断言覆盖加强覆盖率检测.阐述了将断言和覆盖率为导向相结合的验证方法,并用此种方法对USB2.0系统进行了验证.讨论了如何将两种验证方法有效地结合,并且通过比较覆盖率为导向的验证方法与结合断言与覆盖率为导向的验证方法的结果,说明结合断言与覆盖率为导向的验证方法提高了验证过程中的观测性,减少了验证周期.

Combination of Assertion and Coverage-Driven Verification Methodology

With the development of semiconductor,more and more functions are integrated on a chip.This present challenges to the traditional verification methodology and verification approach.In coverage-driven verification methodology,the coverage model which calculates the coverage from the function outside the DUT,is hard to detect the work states inside the DUT,so some functional points are blind spots to this methodology.Assertion-based verification inserting assertion into DUT can enhance detected ability of coverage-driven verification.This paper describes the verification methodology of combination of assertion and coverage-driven,and having verified USB2.0 system with the methodology.This paper also discusses how to combine the two verification methodology efficiently applied to verify system,and shows that combination of assertion and coverage-driven verification improves observation ability in verification progress and reduces the period of verification by comparing the results of coverage-driven verification and combination of assertion and coverage-driven verification.