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Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy |
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| Authors: | Bo Hyun KongQian Sun Jung HanIn-Hwan Lee Hyung Koun Cho |
| Affiliation: | a School of Advanced Materials Science and Engineering, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, South Korea b Department of Electrical Engineering, Yale University, New Haven, CT 06520, USA c School of Advanced Materials Engineering, Chonbuk National University, Jeonju 561-756, South Korea |
| Abstract: | |
| Keywords: | 61.72.Ff 68.37.Lp 81.05.Ea 81.15.Gh |
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