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The impedance caused by interfacial current constriction: a case study on BaF2/YSZ bicrystals
Authors:Matthias Gerstl  Juergen Fleig
Affiliation:(1) Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9/164 EC, 1060 Vienna, Austria
Abstract:Abstract  BaF2/YSZ (yttria stabilized zirconia) bicrystals are investigated by means of impedance spectroscopy. The spectra show two semicircles in the complex impedance plane, and both arcs exhibit very similar temperature dependences. The high frequency semicircle can be attributed to the ideal (quasi one-dimensional) bulk resistance of BaF2, and the low frequency arc is caused by an additional resistance in BaF2 due to the current constriction taking place close to the contact spots at the imperfect bicrystal interface. This interpretation is supported by finite element calculations revealing that bicrystals with imperfect contacts indeed exhibit an additional semicircle in the complex impedance plane even without any ion transfer resistance between the two crystals. The low frequency arc of the BaF2/YSZ bicrystal drastically increases upon bias voltage, but relaxes to its original value after removing the bias. This phenomenon can be associated with a strong decrease of the vacancy concentration in YSZ (close to the interfacial contact spots), which is caused by F ions being pumped into YSZ and acting as a counter dopant to Y3+. Graphical Abstract   MediaObjects/706_2009_123_Figa_HTML.gif
Keywords:Chemistry and materials science  Impedance spectroscopy  Ion conduction  Zirconia
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