Ultrahigh-spatial-resolution photoelectron projection microscopy using femtosecond lasers |
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| Authors: | S. K. Sekatskii S. V. Chekalin A. L. Ivanov V. O. Kompanets Yu. A. Matveets A. G. Stepanov V. S. Letokhov |
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| Affiliation: | (1) Institute of Spectroscopy, Russian Academy of Sciences, 142092 Troitsk, Moscow Region, Russia |
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| Abstract: | Ultrahigh spatial resolution of two-photon photoelectron images (as high as 3 nm, which is the best value that has been achieved to date in photoelectron microscopy with spatial resolution) is obtained when silicon nanotips are irradiated by the second harmonic of a pulsed femtosecond Ti: sapphire laser. In addition, the absolute value of the two-photon external photoeffect coefficient is measured. Zh. éksp. Teor. Fiz. 115, 1680–1688 (May 1999) |
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