Imaging properties of uniaxially anisotropic negative refractive index materials |
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| Institution: | 1. Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, PR China;2. Department of Physics, Fudan University, Shanghai 200433, PR China;1. School of Physics and Information Technology, Shaanxi Normal University, Xi''an 710062, China;2. State Key Laboratory of Advanced Optical Communication Systems and Networks, School of Electronics Engineering and Computer Science, and Center for Quantum Information Technology, Peking University, Beijing 100871, China;1. School of Optoelectronic Engineering, Guangdong Polytechnic Normal University, Guangzhou 510665, PR China;2. School of Physics, Nanjing University, Nanjing 210093, PR China;3. School of Physics and Materials, Guangdong Provincial Engineering and Technology Research Center of Semiconductor Lighting and Backlighting, Guangzhou University, Guangzhou 510006, PR China;4. School of Physics, State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou 510275, PR China |
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| Abstract: | The imaging properties of uniaxially anisotropic negative refractive index materials have been investigated theoretically. Based on an accurate theoretical formulation, we have discussed in detail whether and under what conditions the slabs of uniaxially anisotropic negative refractive index materials will have the power to focus perfectly all Fourier components of an image. It was shown that if the effects of absorption and dispersion can be neglected, under some particular conditions the slabs of uniaxially anisotropic negative refractive index materials will have the power to focus perfectly all E-mode or all H-mode or both E- and H-mode Fourier components of an image. It was also shown that perfect focus cannot occur in the presence of absorption and dispersion, but if the effects of absorption and dispersion are rather small, excellent focus can still occur. |
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