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Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
Authors:C.J. Glover, T. Schmitt, M. Mattesini, M. Adell, L. Ilver, J. Kanski, L. Kjeldgaard, M. Ag  ker, N. M  rtensson, R. Ahuja, J. Nordgren,J.-E. Rubensson
Affiliation:C.J. Glover, T. Schmitt, M. Mattesini, M. Adell, L. Ilver, J. Kanski, L. Kjeldgaard, M. Agåker, N. Mårtensson, R. Ahuja, J. Nordgren,J.-E. Rubensson,
Abstract:Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics.
Keywords:Soft X-ray scattering (RIXS)   Ultrafast dynamics   Semiconductors   Spectroscopy   Synchrotron radiation
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