Optical Metrology by Fringe Processing on Independent Windows Using a Genetic Algorithm |
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Authors: | L E Toledo F J Cuevas |
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Institution: | (1) Department of Optical Metrology, Centro de Investigaciones en óptica, A.C., Loma del bosque 115, Col. Lomas del Campestre, León, 37150, Guanajuato, Mexico |
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Abstract: | We present a method to retrieve the phase of a fringe pattern based on the window fringe pattern demodulation technique (WFPD).
The overlapped phase similarity criterion is avoided in the proposed method, and it is substituted by a second order smoothness
criterion. The fringe processing on independent windows (FPIW) method can measure physical quantities from closed and near
sub-sampled fringe patterns by a simplified cost or fitness function. The fringe image is divided into a set of partially
overlapping windows. In these sub-images the estimated phase is modelled as a parametric analytic-function, and its parameters
are optimized using a genetic algorithm (GA). This analytic-function is used to estimate the phase in the area framed by the
window. Phases from all windows are sequentially spliced to retrieve the whole phase field. A media filter is applied over
the entire phase field to smooth the irregularities that appear in the junctures between windows. |
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Keywords: | Fringe analysis Optical metrology Genetic algorithms Computer vision Digital image processing Phase retrieval |
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