Reflection spectroscopy in microstructured light scattering materials

Summary A theoretical model is derived that describes the influence of lateral light diffusion in a scattering medium on the absorptivity of an absorber spot on top of the substrate. The model uses the lateral resolved reflectivity under point irradiation that has been analyzed experimentally with a scanning-micro-laser-reflectometer. The model allows quantification of the absorptivity by one single equation that contains only the mean radial diffusion length of light and the spot area. Experiment and theory are applied to typical substrates for thin layer chromatography (alumina, silica, cellulose). The diffusion lengths in these substrates are given and the absorptivities of the spots are calculated as a function of the spot area.