| 一种快速分析电子元器件寿命特性的实用方法—图估法 |
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| 引用本文： | 孙振东,王喜山.一种快速分析电子元器件寿命特性的实用方法—图估法[J].青岛大学学报(自然科学版),1995,8(1):65-72. |
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| 作者姓名： | 孙振东 王喜山 |
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| 作者单位： | 清华大学电子工程系，青岛大学物理系 |
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| 摘 要： | 本文较详细介绍了一种用于电子元器件恒定应力正常寿命试验和加速寿命试验的数据处理方法－图估法；作为举例，用该方法分析判断的估计了拟氖激光管的寿命分布规律和分布参数等寿命特性。
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| 关 键 词： | 图估法 电子元件 寿命 可靠性 |
ONE PRACTICAL METHOD FOR FAST ANALYZING THELIFETIME CHARACTERISTICS OF ELECTRONIC DEVICES-GRAPHICAL METHOD |
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| Sun Zhendong.ONE PRACTICAL METHOD FOR FAST ANALYZING THELIFETIME CHARACTERISTICS OF ELECTRONIC DEVICES-GRAPHICAL METHOD[J].Journal of Qingdao University(Natural Science Edition),1995,8(1):65-72. |
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| Authors: | Sun Zhendong |
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| Abstract: | raphical method,the lifetime date fast analyzing method that used in normal and accelerated life test for electronic devices is introduced in detail. As a example, some lifetime characteristics of He-Ne lasers,such as the law of life distribution,distributed parameters and lifetime parameters, are analyzed and estimated according to the graphical method. |
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| Keywords: | graphical method Weibull function He-Ne lasers |
| 本文献已被 CNKI 维普 等数据库收录！ |
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