| 微光像增强器噪声功率谱测试研究 |
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| 引用本文： | 张伟,汪岳峰,董伟. 微光像增强器噪声功率谱测试研究[J]. 光谱学与光谱分析, 2003, 23(3): 621-622 |
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| 作者姓名： | 张伟 汪岳峰 董伟 |
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| 作者单位： | 1. 军械工程学院光学教研室,河北,石家庄,050003
2. 北京理工大学光电工程系,北京,100081 |
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| 摘 要： | 在微光像增强器成像中 ,迭加在图像上的时空域噪声 ,不仅限制系统可工作的最低照度 ,而且使显示图像有随机蠕动颗粒闪烁的外观。适用的噪声性能测试分析技术则可为改善已有系统的成像质量、研制新型高性能的微光成像器件与系统提供必要的基础和客观依据。通过用CCD对像增强器噪声功率谱的测试发现像增强器噪声主要集中在低频部分 ,高频段的噪声近似为白噪声。
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| 关 键 词： | 像增强器 CCD摄像机 噪声检测 功率谱 |
| 文章编号： | 1000-0593(2003)03-0621-02 |
| 修稿时间： | 2001-12-03 |
Testing of the Power Spectrum of Image Intensifier |
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| ZHANG Wei,WANG Yue-feng,DONG Wei . Teaching and Research Section of Optics,Ordnance Engineering College,Shijiazhuang ,China . Opto-electronic Engineering Dept.,Beijing Institute of Technology,Beijing ,China. Testing of the Power Spectrum of Image Intensifier[J]. Spectroscopy and Spectral Analysis, 2003, 23(3): 621-622 |
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| Authors: | ZHANG Wei WANG Yue-feng DONG Wei . Teaching Research Section of Optics Ordnance Engineering College Shijiazhuang China . Opto-electronic Engineering Dept. Beijing Institute of Technology Beijing China |
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| Affiliation: | Teaching and Research Section of Optics, Ordnance Engineering College, Shijiazhuang 050003, China. |
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| Abstract: | In the low-light-level image processing, the time-and-space-domain noise in the signal not only limits the lowest illumination of the system but also makes the image to show random glitter. Applicable testing and analytical technology for noise can enhance the image quality of existing system and provide basis and objective foundation for the development of new image apparatus. From the testing of the power spectrum of image intensifier with the CCD, it was shown that the noise is mostly assembled at the section of low frequency and is approximately white noise at the section of high frequency. |
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| Keywords: | Image intensifier CCD camera Testing of noise Power spectrum |
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