用于“聚龙一号”上软X光通量探测的平响应X光二极管

介绍了聚龙一号上使用的一种由金阴极X光二极管（XRD）和具有特殊构型的复合金滤片构成的平响应XRD探测器, 测量软X光通量的标定和实验情况。该探测器的灵敏度在北京同步辐射的4B7B束线站和4B7A束线站标定。标定的灵敏度显示, 该探测器对0.1~4 keV之间的X光具有近似平坦的响应曲线。根据标定情况和探测器的谱响应特性, 给出了目前该探测器在用于Z箍缩产生的软X光通量诊断中的测量不确定度为12%。在单层钨丝阵Z箍缩实验中, 平响应XRD探测器测得Z箍缩产生的X光功率峰值达到52 TW, 能量达540 kJ。在动态黑腔实验中, 布置在径向和轴向的两套平响应XRD探测器被用于建立径向辐射功率波形和轴向辐射功率波形之间的时间关联。在典型的动态黑腔实验中, 测得轴向辐射功率峰值出现在径向辐射功率前约1.2 ns。

Flat spectral response XRD for diagnosing soft X-ray flux on PTS

In Z-pinch experiments on Primary Test Stand, a specially configured flat spectral response X-ray diode (FSR-XRD) was used to diagnose X-ray flux, which utilized a gold cathode XRD and a compounded gold filter to give rise to a nearly flat spectral response in photon energy range of 0.1-4 keV. To establish an absolute measurement of X-ray flux, each XRD and filter used was calibrated on beam lines 4B7B and 4B7A, Beijing synchrotron radiation facility. In typical experiments, uncertainty of X-ray power measurement inferred by FSR-XRD was 12%. In a single tungsten wire array Z-pinches experiment, diagnosed X-ray power exceeded 52 TW, energy was about 540 kJ. In dynamical hohlraum experiments, an FSR-XRD in the radial and an FSR-XRD in the axial were used to provide a time correlated measurement of X-ray pulse. In a typical dynamical hohlraum experiment, peak of axial X-ray power occurred before radial power by amount of about 1.2 ns.