Distribution of surface states based on Hill and Coleman conductance technique |
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Authors: | R J Singh R S Srivastava |
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Institution: | (1) Department of Physics, Banaras Hindu University, 221 005 Varanasi, India |
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Abstract: | Hill-Coleman’s single frequency conductance technique for the determination of surface state density has been extended upto
2 kHz. A.c. conductance (G
m) and capacitance (C
m)versus gate bias (V
G) curves were obtained at various signal frequencies. Shift of the observed peaks in theG
m versus VG curves for different signal frequencies was utilized for the determination of surface state density at different surface
potentials (φ
s). Determination of surface state density for differentφ
s values was also done by Nicollian-Goetzberger method and the results compared. Results obtained by Hill-Coleman technique
compare reasonably well with those obtained by the other method. |
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Keywords: | Metal-oxide-semiconductor structure a c conductance interface state density surface state distribution |
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