A novel algorithm to study the impact of the mismatch on analog building blocks: a case study in basic 35 nm CMOS amplifiers

In this paper, the context of modeling of the impact of mismatch and statistical variations on analogue circuit building blocks is emphasized. The aim is to develop a new algorithm which predicts the statistical behavior of important parameters of an amplifier including output resistance, voltage gain and trans-conductance. The relative error of standard deviation of statistical parameters will remain less than 5% compared with the most accurate Monte-Carlo (MC) simulations using atomistic library model-cards. In comparison with other models which are based on the normal distribution of parameters, the proposed model does not need this limiting presumption. On the other hand, the proposed algorithm is more efficient compared with time consuming MC atomistic simulations.