A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks |
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Authors: | Pantoja-Cortés Juan Sánchez-Bajo Florentino Ortiz Angel L |
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Affiliation: | Departamento de Física Aplicada, Universidad de Extremadura, 06006 Badajoz, Spain. |
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Abstract: | Nanograin sizes and crystal lattice microstrains in nanocrystalline materials are typically evaluated from the broadening of their x-ray diffraction (XRD) peaks under the assumption of symmetrical diffraction profiles. Since this assumption is not entirely satisfactory, we formulate a line-broadening analysis model of a single peak that considers explicitly the XRD peak asymmetry. The model is a generalization of the variance method in which the shape of the XRD peaks is idealized through asymmetrical split pseudo-Voigt functions. The model is validated on two nanocrystalline powders. |
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