Stresses in a quasi-isotropic pin-loaded connector using photoelasticity |
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Authors: | M W Hyer D Liu |
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Institution: | (1) Department of Engineering Science and Mechanics, Virginia Polytechnic Institute and State University, 24061 Blacksburg, VA |
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Abstract: | Birefringent glass-epoxy and a numerical stress-separation scheme are used to compute the stresses in the vicinity of a pin-loaded hole. The radial and circumferential stresses at the hole edge, and the net-section and shear-out stresses are computed. The numerical and experimental results of other investigators are compared with the computed stresses. The fixture used to load the connector is discussed and typical isochromatic- and isoclinic-fringe patterns are presented. The stress-separation scheme is briefly described. |
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