The molecular structure and conformation of dichlorotetramethyldisiloxane as determined by gas phase electron diffraction

Dichlorotetramethyldisiloxane is studied by gas-phase electron diffraction at room temperature. The least-squares values of the bond distances (r_g) and bond angles () are: r(C---H)=1.084(5) Å, r(Si---O) = 1.624(2) Å, r(Si---C) = 1.852(2) Å, r(Si---Cl) = 2.067(2) Å, SiOSi = 154.0° (1.5), ClSiO = 110.2° (0.8), ClSiC = 109.6°(0.7), HCSi = 111.7°(1.5), OSiC = 110.0°(0.8), τ₁ (zero corresponds to the Si---Cl bond trans to the Si---O---Si linkage) = 78°(6) and τ₂ = 141°(19). A two-conformer model cannot be ruled out.