Tetragonal distortion and the domain structure of thin Pb(Zr,Ti)O3/MgO(100) films |
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Authors: | DY Noh HC Kang TY Seong JH Je HK Kim |
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Institution: | (1) Department of Materials Science and Engineering, and Center for Electronic Materials Research, Kwangju Institute of Science and Technology, Kwangju, Korea (Fax: +82-62/970-2304, E-mail: dynoh@matla.kjist.ac.kr), KR;(2) Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, Korea, KR;(3) Department of Physics, Pusan National University, Pusan, Korea, KR |
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Abstract: | 3 /MgO(100) films was studied in synchrotron X-ray scattering experiments. In the thin epitaxial films, the tetragonal distortion
of the ferroelectric phase and the transition temperature were significantly reduced. In sharp contrast to the reported mixture
of the a-type and the c-type domains in thicker films, the 250-Å-thick film was purely composed of the c-type domains in the
tetragonal phase. We attribute the suppression of the transition to the substrate effect, which prefers the c-type domains
near the interface, and reduces the tetragonal distortion to minimize the strain energy caused by the lattice mismatch.
Received: 1 November 1997/Accepted: 5 January 1998 |
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Keywords: | PACS: 77 84Dy 64 70 kb 68 55 -a 81 30 -Z |
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