(1) Tomsk State University, Tomsk, 634050, Russia;(2) Institute of Physics of Strength and Materials Science, Siberian Division of the Russian Academy of Sciences, Toms, 634021, Russia
Abstract:
A method of microdoping subsurface semiconductor layers with hydrogen ions (protons) with the use of a plasma-beam discharge is suggested. The method was tested on gallium arsenide layers and was proven to be more efficient than other well-known methods used for modifying subsurface layers.