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Statistical analyses of repolarisation current of a PZT film deposited on ITO electrode with different thermal treatments
Authors:Salvatore Marino  Andrei Th. Ionescu  Anca-Luiza Alexe-Ionescu  Gaetano Nicastro  Giuseppe Strangi
Affiliation:1. INFM-CNR-LICRYL Laboratory-CEMIF.CAL, Department of Physics , University of Calabria , Via P. Bucci, Cubo 33B, 87036 Rende (CS), Italy;2. Facultatea de Fizica, Universitatea din Bucuresti , P.O.B MG-11, Ro-077125 Bucharest, Romania;3. Faculatea de Stiinte Aplicate, Universitatea ‘‘Politehnica’’ din Bucuresti , Splaiul Independentei 313, Ro-060042 Bucharest, Romania
Abstract:In the vast application fields of lead zirconate titanate (PZT) thin films, of particular interest are the interaction effects occurring at the ferroelectric–substrate interface [E. Bruno, M.P. De Santo, M. Castriota, S. Marino, G. Strangi, E. Cazzanelli and N. Scaramuzza, J. Appl. Phys. 103 (2008) p.064103; S. Dunn and R.W. Whatmore, J. Eur. Ceram. Soc. 22 (2002) p.825]. Relevant for this purpose are polarity-sensitive liquid crystals (LC) cells and micro- and nanoelectronic applications [S. Marino, M. Castriota, G. Strangi, E. Cazzanelli and N. Scaramuzza, J. Appl. Phys. 102, selected for Virtual Journal of Nanoscale Science & Technology, 30 July 2007 (2007) p.013002]. The polarisation current was investigated of a PZT film (PbZr0.47Ti0.53O3) obtained by sol–gel synthesis and deposited by spin coating on an indium tin oxide (ITO) electrode. The different behaviour exhibited by such a system when the support electrode was previously submitted to a thermal treatment was attributed to the change of the electrical properties of the ITO layer. In particular, a higher negative charge in the conductive band of the ITO electrode seems to be responsible for a higher order in the ferroelectric film.
Keywords:PZT film  repolarisation current  thermal treatment  ferroelectric properties
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