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Statistical analyses of repolarisation current of a PZT film deposited on ITO electrode with different thermal treatments
Authors:Salvatore Marino  Andrei Th Ionescu  Anca-Luiza Alexe-Ionescu  Gaetano Nicastro  Giuseppe Strangi
Institution:1. INFM-CNR-LICRYL Laboratory-CEMIF.CAL, Department of Physics , University of Calabria , Via P. Bucci, Cubo 33B, 87036 Rende (CS), Italy;2. Facultatea de Fizica, Universitatea din Bucuresti , P.O.B MG-11, Ro-077125 Bucharest, Romania;3. Faculatea de Stiinte Aplicate, Universitatea ‘‘Politehnica’’ din Bucuresti , Splaiul Independentei 313, Ro-060042 Bucharest, Romania
Abstract:In the vast application fields of lead zirconate titanate (PZT) thin films, of particular interest are the interaction effects occurring at the ferroelectric–substrate interface E. Bruno, M.P. De Santo, M. Castriota, S. Marino, G. Strangi, E. Cazzanelli and N. Scaramuzza, J. Appl. Phys. 103 (2008) p.064103; S. Dunn and R.W. Whatmore, J. Eur. Ceram. Soc. 22 (2002) p.825]. Relevant for this purpose are polarity-sensitive liquid crystals (LC) cells and micro- and nanoelectronic applications S. Marino, M. Castriota, G. Strangi, E. Cazzanelli and N. Scaramuzza, J. Appl. Phys. 102, selected for Virtual Journal of Nanoscale Science & Technology, 30 July 2007 (2007) p.013002]. The polarisation current was investigated of a PZT film (PbZr0.47Ti0.53O3) obtained by sol–gel synthesis and deposited by spin coating on an indium tin oxide (ITO) electrode. The different behaviour exhibited by such a system when the support electrode was previously submitted to a thermal treatment was attributed to the change of the electrical properties of the ITO layer. In particular, a higher negative charge in the conductive band of the ITO electrode seems to be responsible for a higher order in the ferroelectric film.
Keywords:PZT film  repolarisation current  thermal treatment  ferroelectric properties
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