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Combined effects of crystallographic orientation,stacking fault energy and grain size on deformation twinning in fcc crystals
Authors:W.Z. Han  Z.F. Zhang  S.X. Li
Affiliation:1. Shenyang National Laboratory for Materials Science , Institute of Metal Research, Chinese Academy of Sciences , Shenyang, China wzhan@imr.ac.cn;3. Shenyang National Laboratory for Materials Science , Institute of Metal Research, Chinese Academy of Sciences , Shenyang, China
Abstract:
Keywords:equal channel angular pressing (ECAP)  deformation twin  FCC crystal  stacking fault energy  grain size
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