a The authors, with the exception of S. Hattori, are with the Department of Electronic Engineering, Janazawa University, Kanazawa, Japan
b S. Hattori is with the Department of Electronic Engineering, Nagoya University, Nagoya, Japan
Abstract:
A method of measuring optical phase differences caused by the presence of optical path differences between two coherent light beams is reported. A polarization technique is used and the phase differences are detected as rotation angles of the plane of polarization. The sensitivity of the method is better than 10-4λ and the stability is 3 X 10-4λ per minute. These limitations result from thermal fluctuations of the order of 10-3°C. A higher sensitivity of about 10-5λ, or better, is expected if the effect due to thermal fluctuations can be reduced.