| X射线荧光光谱分析的现状和进展 |
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| 引用本文： | 陈远盘.X射线荧光光谱分析的现状和进展[J].光谱学与光谱分析,1995,15(2):103-111. |
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| 作者姓名： | 陈远盘 |
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| 作者单位： | 中国有色金属工业总公司矿产地质研究院 |
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| 摘 要： | 本文综述了常规Ｘ射线荧光（ＸＲＦ）、同步辐射ＸＲＦ，全反射ＸＲＦ和其他ＸＲＦ等四个方面的ＸＲＦ光谱分析的现状和进展。
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| 关 键 词： | 同步辐射 全反射 XRF 综述 |
THE PRESENT STATE AND ADVANCE OF XRF SPECTROMETRY |
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| CHEN Yuanpan.THE PRESENT STATE AND ADVANCE OF XRF SPECTROMETRY[J].Spectroscopy and Spectral Analysis,1995,15(2):103-111. |
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| Authors: | CHEN Yuanpan |
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| Abstract: | This paper is a review of XRF spectrometry. It is classfied as four parts, namely normal XRF, synchrotron radiation XRF, total reflection XRF and other XRF, to describe the present state and advance of XRF spectrometry. |
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| Keywords: | Normal XRF SRXRF TRXRF |
| 本文献已被 CNKI 维普 等数据库收录！ |
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