(1) Department of Physical Chemistry, Kaunas University of Technology, Radvilienu pl. 19, 3028 Kaunas, Lithuania;(2) Institute of Physical Electronics, Kaunas University of Technology, Savanoriu pr. 271, 3009 Kaunas, Lithuania
Abstract:
Mo-Se thin films have been electrodeposited on conducting tin oxide (SnO2) coated glass substrates from a sulfamatic solution containing Na2MoO4 and H2SeO3 under potentiostatic conditions. The deposition potential varied from –0.6 V to –0.9 V, at a deposition temperature of 20–40 °C and pH 6.5. X-ray diffraction analysis revealed that the overall composition of the films deposited is consistent with the formation of MoO2 and MoSe2. The lattice parameters of the as-deposited MoSe2 are a=b=3.2340 Å and c=13.2859 Å, which fits a hexagonal structure.