Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy |
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Authors: | Stomp Romain Miyahara Yoichi Schaer Sacha Sun Qingfeng Guo Hong Grutter Peter Studenikin Sergei Poole Philip Sachrajda Andy |
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Affiliation: | Department of Physics, McGill University, 3600 rue University, Montreal, H3A2T8, Canada. |
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Abstract: | Single-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct jumps when the tip was positioned above the dot. The observed jumps in the frequency shift, with corresponding peaks in dissipation, are attributed to a single-electron tunneling between the dot and the back electrode governed by the Coulomb blockade effect, and are consistent with a model based on the free energy of the system. The observed phenomenon may be regarded as the "force version" of the Coulomb blockade effect. |
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