Microsecond studies of layer motion in a ferroelectric liquid crystal device

Small angle X-ray scattering has been employed to study dynamically the layer motion in a ferroelectric liquid crystal device on application of low electric fields. Microsecond time resolution was achieved and the use of an area detector in the experiment allowed the examination of layer motion in two orthogonal planes. The X-ray data show that during switching the chevron structure adopted by the layers distorts, implying a variation in the chevron angle. A rotation of the layers in the plane of the device is also observed, coincident in time with the change in chevron angle. The motion of the layers takes place on a ten microsecond time scale and the angular rotation of the layers is approximately 1°.