A method to correct defocused element distribution maps in electron probe microanalysis |
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Authors: | M. Kluckner O. Brandl S. Weinbruch F. J. Stadermann H. M. Ortner |
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Affiliation: | (1) Technische Hochschule Darmstadt, Fachbereich Materialwissenschaft, Fachgebiet Chemische Analytik, Petersenstr. 23, D-64287 Darmstadt, Federal Republic of Germany;(2) Max-Planck-Institut für Polymerforschung, Ackermannweg 10, Postfach 3148, D-55020 Mainz, Federal Republic of Germany |
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Abstract: | Element distribution maps obtained on electron microprobes via the beam scan method with wavelength-dispersive spectrometers reveal a defocusing effect if they are taken at sufficiently small magnification. This effect, which occurs where the Bragg condition of the spectrometer is not adequately met, can be avoided or corrected by various methods. A method is presented here to correct defocused element distribution maps with the help of corresponding maps obtained on homogeneous standards.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday |
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Keywords: | electron probe microanalysis element distribution mapping |
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