| 电子弛豫过程对重复频率高功率微波大气击穿的影响 |
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| 引用本文： | 胡涛, 周东方, 李庆荣, 等. 电子弛豫过程对重复频率高功率微波大气击穿的影响[J]. 强激光与粒子束, 2009, 21(04). |
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| 作者姓名： | 胡涛 周东方 李庆荣 牛忠霞 |
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| 作者单位： | 1.信息工程大学 信息工程学院, 郑州 450002;;;2.解放军61 085部队, 杭州 31 1 200 |
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| 摘 要： | 研究了重复频率高功率微波脉冲作用下的大气击穿。分析了重复频率脉冲作用下电子的弛豫过程，对脉冲间隔时间内电子温度和自由电子密度的变化规律进行了研究，得出了电子温度弛豫时间远小于电子密度弛豫时间的结论。分析了电子弛豫过程的附着效应和复合效应，给出了高功率微波重复频率脉冲作用下发生大气击穿的条件和重复频率高功率微波大气击穿的电子数密度方程。
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| 关 键 词： | 高功率微波 电子弛豫过程 重复频率 大气击穿 |
Effect of electronic relaxation process on air breakdown caused by repetition frequency HPM |
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| hu tao, zhou dongfang, li qingrong, et al. Effect of electronic relaxation process on air breakdown caused by repetition frequency HPM[J]. High Power Laser and Particle Beams, 2009, 21. |
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| Authors: | hu tao zhou dongfang li qingrong niu zhongxia |
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| Affiliation: | 1. Institute of Information Engineering,Information Engineering University,Ｚhengzhou 450002,China;;;2. PLA Unit 61085,Ｈangzhou 311200,China |
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| Abstract: | Air breakdown caused by repetition frequency high power microwave (HPM) has been investigated. The electronic relaxation process affected by repetition frequency pulses has been analyzed, and variations regulation of the electron temperature and free electron density pulsein interval time has been studied, It is found that the electron temperature relaxation time is far less than the electron density relaxation time. This paper analyzes the attachment and recombination effects in the electronic relaxation process, and present the occurrence condition of air breakdown caused by repetition frequency HPM, and the electronic density equation of the air breakdown. |
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| Keywords: | high power microwave electronic relaxation process repetition frequency air breakdown |
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