Design and performance of an X‐ray scanning microscope at the Hard X‐ray Nanoprobe beamline of NSLS‐II |
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Authors: | E. Nazaretski H. Yan K. Lauer N. Bouet X. Huang W. Xu J. Zhou D. Shu Y Hwu Y. S. Chu |
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Affiliation: | 1. Brookhaven National Laboratory, Upton, NY11973, USA;2. SLAC National Accelerator Laboratory, Menlo Park, CA94025, USA;3. Advanced Photon Source, Argonne National Laboratory, Argonne, IL60439, USA;4. Institute 5. of 6. Physics, Academia Sinica, Taipei11529, Taiwan |
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Abstract: | A hard X‐ray scanning microscope installed at the Hard X‐ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ~15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities. |
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Keywords: | X‐ray microscopy multilayer Laue lenses nanoprobes |
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