Measurement error models and variance estimation in the presence of rounding error effects |
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| Authors: | T Burr M S Hamada T Cremers B P Weaver J Howell S Croft S B Vardeman |
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| Institution: | (1) Statistical Sciences, Los Alamos National Laboratory, P. O. Box 1663, MS F600, Los Alamos, NM 87545, USA;(2) Nuclear Process Infrastructure, Los Alamos National Laboratory, P.O. Box 1663, MS G735, Los Alamos, NM 87545, USA;(3) Department of Mechanical Engineering, University of Glasgow, University Avenue, Glasgow, G12 8QQ, Scotland, UK;(4) Nuclear Safeguards Science and Technology, Los Alamos National Laboratory, P.O. Box 1663, MS E540, Los Alamos, NM 87545, USA;(5) Departments of Statistics and Industrial and Manufacturing Systems Engineering, Iowa State University, Ames, IA 50011, USA |
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| Abstract: | An approach to estimating measurement error variances for any instrument having round-off effects that might also have instrument
bias is presented. Recently finite instrument resolution effects on error variances have been studied, but negligible instrument
bias was assumed and the contexts were different than considered here. Our intent is to use repeated measurements on several
standards to estimate the instrument’s random and systematic error variances. Recognizing that rounding impacts item bias
and variance in a manner that depends on the true value, an approach is presented to estimate random error variance and instrument
systematic error variance. The key finding is that item-specific bias can interfere with the estimation of overall instrument
bias unless appropriate error modeling and associated inference steps are taken. |
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