首页 | 本学科首页   官方微博 | 高级检索  
     检索      

有机复合薄膜中超高密度信息存储研究
引用本文:马立平,杨文军,薛增泉,陈慧英,庞世瑾.有机复合薄膜中超高密度信息存储研究[J].物理学报,1998,47(7):1229-1232.
作者姓名:马立平  杨文军  薛增泉  陈慧英  庞世瑾
作者单位:(1)北京大学电子学系,北京 100871; (2)北京大学化学系,北京 100871; (3)中国科学院物理研究所和凝聚态物理中心北京真空物理实验室,北京 100080
摘    要:利用大气中工作的扫描隧道显微镜,在真空蒸发方法制备的有机复合薄膜上,通过施加电压脉冲法做出了信息点阵,信息点大小为1.3nm.电流-电压特性表明:存储区表现为导体特性,非存储区为绝缘体特性.信息存储实验表明:相邻两个信息记录点的间距可小于2nm,信息存储密度可高达2.5×1013bit/cm2.对信息存储的机制进行了初步分析. 关键词

关 键 词:超高密度  信息存储  薄膜  有机复合薄膜
收稿时间:1998-04-16

STUDY OF ULTRAHIGH DENSITY DATA STORAGE ON ORGANIC-COMPLEX THIN FILMS
MA LI-PING,YANG WEN-JUN,XUE ZENG-QUAN,CHEN HUI-YING and PANG SHI-JIN.STUDY OF ULTRAHIGH DENSITY DATA STORAGE ON ORGANIC-COMPLEX THIN FILMS[J].Acta Physica Sinica,1998,47(7):1229-1232.
Authors:MA LI-PING  YANG WEN-JUN  XUE ZENG-QUAN  CHEN HUI-YING and PANG SHI-JIN
Abstract:Crystalline organic complex thin films have been performed by vacuum evaporation method on HOPG substrates.Using Scanning Tunneling Microscope storage,array has been made on the film by applying voltage pulses between the tip and the substrate.The recording marks are 1.3nm in diameter.Voltage-current characterization shows that the recorded region has a conductor behavior while the unrecorded regions shows an insulator behavior.It is confirmed from experiments that the distance between two recording marks can be as short as 2nm,which corresponds to the storage density of 2.5×1013bit/cm2.The mechanism about the recording is briefly discussed.
Keywords:
本文献已被 CNKI 维普 等数据库收录!
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号