| 石墨样品中杂质元素的X-射线荧光光谱法直接测定 |
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| 引用本文： | 包生祥.石墨样品中杂质元素的X-射线荧光光谱法直接测定[J].分析测试学报,1989(3). |
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| 作者姓名： | 包生祥 |
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| 作者单位： | 中国科学院兰州地质研究所 |
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| 摘 要： | 本文介绍X-射线荧光光谱分析石墨中15个杂质元素的方法。首次提出用化探标样按不同比例稀释在石墨粉中研制标准样品。以纤维素作粘结剂直接粉末压片,本法适用于石墨精矿和石墨产品的分析。
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| 关 键 词： | X-射线荧光光谱 石墨 杂质元素分析 |
X-Ray Fluorescent Spectrometric Determination of Impurities in Graphite |
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| Bao Shengxiang Lanzhou Institute of Geology,Academia Sinica.X-Ray Fluorescent Spectrometric Determination of Impurities in Graphite[J].Journal of Instrumental Analysis,1989(3). |
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| Authors: | Bao Shengxiang Lanzhou Institute of Geology Academia Sinica |
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| Abstract: | Rigaku 3080E_3 X-ray spectrometer is used for the rapid analysis of impurities in graphitesamples. Synthetic reference samples are prepared by mixing geochemical standard referencematerial with graphite powder(S,p.). Addition of microcrystalline cellulose to samples as abinder enables preparation of briquetes. The method appears low detection limits, high precision,and results which agree with those given by ICP-AES method. |
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| Keywords: | X-Ray fluorescence spectrometry graphite impurities analysis |
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