Vibrational spectra of thin eulytine films

This is a study of IR reflection spectra of systems of a thin Bi₄X₃O₁₂(X=Si, Ge) film and a substrate of fused quartz v-SiO₂ in the range 400–1600 cm⁻¹ at T=295 K. Bands assigned to Bi₄X₃O₁₂ are interpreted. It is found that single-photon processes are exhibited in the range 400–800 cm⁻¹, while biphonon processes, in the range 800–1600 cm⁻¹. I. Franko State University of Lvov, 50 Dragomanov St., 290005, Lvov, Ukraine. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 64, No. 4, pp. 494–498, July–August, 1997.