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分光仪调整中干涉现象的分析与应用
引用本文:刘金,李朝荣,汪世英,张一波.分光仪调整中干涉现象的分析与应用[J].大学物理,2009,28(4).
作者姓名:刘金  李朝荣  汪世英  张一波
作者单位:1. 北京航空航天大学,电子信息工程学院,北京,100191
2. 北京航空航天大学,理学院,北京,100191
3. 北京大学,物理学院,北京,100871
4. 北京航空航天大学,航空科学和工程学院,北京,100191
摘    要:描述了在分光仪调整实验中观察到的干涉条纹现象,并且当转动平行平板玻璃时,该干涉条纹有粗细疏密变化.本文从理论上分析了产生干涉条纹及干涉条纹疏密粗细变化的原因.在已知平行平板玻璃的厚度和光的波长的情况下,可应用该现象测量平行平板玻璃折射率,给出了折射率的计算方法,对结果进行了数据处理及误差分析.

关 键 词:分光仪  干涉条纹  粗细疏密变化  折射率

Analysis and application of the interference phenomenon in spectrometer adjustment
LIU Jin,LI Chao-rong,WAN Shi-ying,ZHANG Yi-bo.Analysis and application of the interference phenomenon in spectrometer adjustment[J].College Physics,2009,28(4).
Authors:LIU Jin  LI Chao-rong  WAN Shi-ying  ZHANG Yi-bo
Institution:1. School of Electronic and Information Engineering;Beihang University;Beijing 100191;China;2. School of Science;3. School of Physics;Peking University;Beijing 100871;4. School of Aeronautic Science and Engineering;China
Abstract:An interference phenomenon in the experiment of adjusting spectrometer is discussed mainly. When turning the glass used in the experiment to adjust the verticality between the axis of telescope and the axis of the apparatus, an interference phenomenon together with variation in width of the stripe can be seen. The reason of the phenomenon and variation of the stripe in theory are analyzed. If one knows how thick the reflector is and the wavelength of the light used in the lab in advance, one can use this ph...
Keywords:spectrometer  interference stripe  thickness and density changes of the stripe  refractive index  
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