| S校正电容器损耗测试频率分析 |
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| 引用本文： | 储松潮.S校正电容器损耗测试频率分析[J].电子元件与材料,1998,17(3):36-37,39. |
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| 作者姓名： | 储松潮 |
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| 作者单位： | 安徽铜峰电子股份有限公司 |
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| 摘 要： | 通过试验和分析说明彩电用Ｓ校正电容器ｔｇδ的测试频率为１ｋＨｚ是不合适的，应选用更高一些的频率。当选用１０ｋＨｚ测试，ｔｇδ控制在４０×１０－４以下比较合适。
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| 关 键 词： | 金属化聚丙烯电容器 S校正 损耗－频率特性 |
Analysis of the DF test frequency for capacitors in S correction circuits. |
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| Chu Songcao.Analysis of the DF test frequency for capacitors in S correction circuits.[J].Electronic Components & Materials,1998,17(3):36-37,39. |
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| Authors: | Chu Songcao |
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| Abstract: | Test results show that DF test frequency for capacitors in S correction circuits in color TV sets should not higher than 1 kHz, and when the frequency being 10 kHz , tgδ shoud be lower than 40×10 4 .(no refs ) |
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| Keywords: | metallized polypropylene capacitors S correction DF frequency characteristic |
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