Non-destructive profiling of fluorine in teeth to large depths

A new method for non-destructive depth profiling of fluorine has been developed which extends the profiling range to much larger depths than hitherto possible. In this method the thick-target yield of 6–7 MeV gammas from the reaction of ¹⁹F(p,αγ) ¹⁶O in the tooth sample, was measured as a function of the incident energy from threshold to up to 2.7 MeV and the yield curve plotted. This curve was compared to the calculated yield curve of 6–7 MeV gammas from the same reaction but on an enamel matrix containing uniformly distributed fluorine. The difference in the shape of the two curves was only due to the non-uniform distribution of fluorine in the tooth sample, which could then be calculated. By making use of this method F-depth profiles in teeth of monkeys were determined non-destructively to a depth of 14 μm. This method is also applicable for profiling other elements through appropriate resonant or non-resonant nuclear reactions.