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Evolved gas analysis-mass spectrometry using skimmer interface and ion attachment mass spectrometry
Authors:T. Tsugoshi  T. Nagaoka  K. Hino  T. Arii  M. Inoue  Y. Shiokawa  K. Watari
Affiliation:(1) Advanced Sintering Technology Group, Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology, 2266-98 Anagahora, Shimo-shidami, Moriyama-ku, Nagoya 463-8560, Japan;(2) Advanced Sintering Technology Group, Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology, 2266-98 Anagahora, Shimo-shidami, Moriyama-ku, Nagoya 463-8560, Japan;(3) ANELVA Technix Corporation, 5-8-1 Yotsuya, Fuchu-shi, Tokyo 183-8508, Japan;(4) Thermal Analysis Group, Strategic Business Unit, Rigaku Corporation, 3-9-12 Matsubara, Akishima, Tokyo 196-8666, Japan;(5) ANELVA Technix Corporation, 5-8-1 Yotsuya, Fuchu-shi, Tokyo 183-8508, Japan;(6) ANELVA Technix Corporation, 5-8-1 Yotsuya, Fuchu-shi, Tokyo 183-8508, Japan;(7) Advanced Sintering Technology Group, Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology, 2266-98 Anagahora, Shimo-shidami, Moriyama-ku, Nagoya 463-8560, Japan
Abstract:Summary A new EGA-MS instrument consisted of a combination of skimmer interface with no change of evolved gaseous species and IAMS (Ion Attachment Mass Spectrometry) with no fragmentation during the ionization has been developed successfully. As its application of evolved gaseous species from PVA as firing process of alumina ceramics binder, the method has indicated detection of gaseous species which have not been detected with Py-GC-MS.
Keywords:GC-MS  binder  EGA-MS  IAMS  skimmer interface
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