| 线阵CCD高精度测隙装置的研制 |
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| 引用本文： | 王雷阳,李正生,冯晓伟.线阵CCD高精度测隙装置的研制[J].电子设计工程,2011,19(15):67-71. |
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| 作者姓名： | 王雷阳 李正生 冯晓伟 |
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| 作者单位： | 第二炮兵工程学院101室,陕西西安,710025 |
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| 摘 要： | 传统的机械式缝隙测量存在着耗时长、精度低的缺点,设计了一种以线阵CCD作为光电传感器的测隙装置。首先设计了测隙装置的总体方案,分析了方案的可行性;其次以CPLD为驱动利用Verlog-HDL语言设计了线阵CCD的工作时序,在对输出信号分析的基础上,设计了适用于本装置的二值化电路;最后以单片机采集数据并实现了和PC间的通讯。从实验结果来看,方案达到了设计中的要求,测量分辨率达到了±0.011 mm。
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| 关 键 词： | 缝隙测量 线阵CCD CPLD 单片机 |
Research and development of high-accuracy device measuring clearance based on linear array CCD |
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| WANG Lei-yang,LI Zheng-sheng,FENG Xiao-wei.Research and development of high-accuracy device measuring clearance based on linear array CCD[J].Electronic Design Engineering,2011,19(15):67-71. |
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| Authors: | WANG Lei-yang LI Zheng-sheng FENG Xiao-wei |
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| Institution: | (Department one,Second Artillery Engineering University,Xi’an 710025,China) |
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| Abstract: | Because the traditional method measuring clearance based on mechanical device,which exists the shortcomings of time-consuming and low accuracy,this paper designs a type of measurement clearance device with linear array CCD as photoelectric sensor.Firstly, |
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| Keywords: | measuring clearance linear array CCD CPLD microcontroller |
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