Nonlinear imaging of embedded microstructures inside transparent materials with laser-induced ionization microscopy

We present a novel nonlinear imaging method that utilizes femtosecond laser-induced plasma emission to probe microscopic structures embedded inside transparent materials. This nonlinear diagnostic tool can resolve either elemental or structural variations of the sample of interest and provide significant improvements over the ordinary linear microscopes by having much higher contrast ratios for the observed areas of different refractive indices. Examples of using this technique to examine the microstructures fabricated by ultrashort laser pulses inside optical glass are presented.