Retroreflective projection gratings |
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Authors: | Xianzhu Zhang Walter P. T. North |
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Affiliation: | Department of Mechanical and Materials Engineering, University of Windsor, 401 Sunset Avenue, Windsor, Ontario, Canada N9B 3P4 |
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Abstract: | A retroreflective projection grating technique has been investigated to inspect quasi flat and specular surfaces. The method introduces the flexibility to adjust the properties of the grating to a specific application or to move it as a whole, in order to use phase shifting technology. Three types of optical configuration have been demonstrated. The method has been tested with a quantified artifact. The experiment shows that it can successfully recover the contour and amplitude of the surface waviness on the artifact. The method can be developed for industrial application in nondestructive testing and evaluation (NDTE). |
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Keywords: | Retroreflection Projection grating Grating analysis Optomechatronics Surface measurement Quantified artifact Nondestructive testing and evaluation (NDTE) |
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