Secondary ion emission from organic films under bombardment with a 32S beam at 3 MeV/A |
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| Authors: | F. Riggi R. M. Spina |
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| Affiliation: | 1. Dipartimento di Fisica , Università di Catania , Corso Italia 57, 195129 , Catania , Italy;2. Istituto Nazionale di Fisica Nucleare , Sezione di Catania |
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| Abstract: | Abstract An experimental investigation of the secondary ion emission from organic films under heavy ion bombardment at high energies was carried out by using a time-of-flight mass spectrometer coupled to a Tandem heavy ion accelerator. Preliminary results obtained at 3 MeV/A are reported and discussed. |
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| Keywords: | desorption sputtering mass spectrometry |
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