| Abstract: | The review considers the present state of the art in the field of x-ray interferometry and its potential use for detecting and measuring nanometer-scale translations of microobjects. Basic physical models used for producing and investigating x-ray wave interference and moire patterns are presented. To whom correspondence should be addressed. Institute of Electronics, National Academy of Sciences of Belarus, 22, Logoiskii Trakt, Minsk, 220841, Belarus. Translated from Zhurnal Prikladnoi Spekiroskopi, Vol. 66, No. 4, pp. 451–459, July–August, 1999. |
