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Orientation Sensitive EELS-analysis of Boron Nitride Nanometric Hollow Spheres |
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| Authors: | C Souche B Jouffrey G Hug M Nelhiebel |
| Institution: | a LMSS-Mat URA 850, ECP, Gde Voie des Vignes, 92295 Chatenay-Malabry, France b LEM, ONERA-CNRS, BP 72, 92322 Chatillon, France c Institut fur Angewandte und Technische Physik, Technische Universitat Wien, Wiedner Hauptstrasse 8-10, A-1040 Wien, Austria |
| Abstract: | We present a theory for the inelastic scattering cross-section in hexagonal boron nitride. Explicitly accounting for effects of beam convergence and a finite collection aperture, we present an approach that well describes the form of the observed Boron K-edge. We use this technique to investigate the crystallographic structure of boron nitride nanometric hollow spheres. |
| Keywords: | hexagonal boron nitride EELS transmission electron microscopy |
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