Structural,Optical, and Electrical Characteristics of Zinc Oxide and Copper Oxide Films and Their Heterojunctions |
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| Authors: | L. Nkhaili M. Elyaagoubi A. El kissani A. El Khalfi A. Elfathi |
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| Affiliation: | 1. Solid State Physics and Thin Films Laboratory, Faculty of Sciences Semlalia, Cadi Ayyad University, Marrakech, Morocco;2. Laboratoire de Génie Industriel, Département de Physique, FST, Université Sultan Moulay Slimane, Beni Mellal, Morocco |
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| Abstract: | In this paper, n-Zinc oxide/p-copper oxide heterojunctions were fabricated by RF-sputtering on indium tin oxide-covered glass substrates. The structural and optical properties of the copper oxide and zinc oxide films were analyzed by X-ray diffraction, Fourier transform infrared, scanning electronic microscopy and ultraviolet-visible spectroscopy. The electrical junction properties were investigated by current–voltage (I–V) characteristics. Additionally, both capacitance (C) and conductance (G) versus frequency (f) measurements were realized at room temperature. The junctions showed a rectifying behavior, and C and G varied with both voltage and frequency. |
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| Keywords: | current–voltage (I–V) heterojunction metal oxide RF-sputtering |
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