Affiliation: | (1) Department of Electrical and Electronic Engineering and Department of Physics, University of Hong Kong, Pokfulam Road, Hong Kong;(2) Department of Electrical and Electronic Engineering, Hong Kong University of Science and Technology, Clearwater Bay, Hong Kong;(3) Department of Chemistry, University of Hong Kong, Pokfulam Road, Hong Kong |
Abstract: | The optical functions of PTCDA have been determined by spectroscopic ellipsometry. The samples were prepared by thermal evaporation of PTCDA on glass substrates. The influence of the substrate temperature on the properties of PTCDA films has also been investigated. The lowest substrate temperature investigated here was room temperature. At room temperature and higher substrate temperatures, we have not observed ordering of the evaporated films, which would result in high anisotropy, as reported for PTCDA films grown by organic molecular-beam deposition at very low temperatures (so-called quasi-epitaxial growth). Therefore, the samples have been assumed to be isotropic. The obtained imaginary part of the dielectric function exhibits the expected features: a low-magnitude peak around 370 nm and a higher magnitude, two-peak structure in the 400–600 nm spectral region. PACS 78.20.Ci; 78.66.Qn |