Extraction of important electrical parameters of CuO |
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Authors: | T. SerinA. Yildiz ?. Horzum ?ahinN. Serin |
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Affiliation: | a Department of Engineering Physics, Faculty of Engineering, Ankara University, 06100 Ankara, Turkey b Department of Physics, Faculty of Science and Arts, Ahi Evran University, 40040 Kirsehir, Turkey |
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Abstract: | Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications. |
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Keywords: | CuO Dip coating technique Electrical parameters Compensation ratio |
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